Integration Test Registers

Table 13-3 Input signals that can be read by the Integration Test Registers

Signal

Register

Bit Register description

 

 

 

 

DBGRESTART

ITMISCIN

[11] See ITMISCIN Register (Miscellaneous Inputs) on page 13-8

 

 

 

 

ETMEXTOUT[1:0]

ITMISCIN

[9:8]

 

 

 

 

 

nETMWFIREADY

ITMISCIN

[5]

 

 

 

 

 

nIRQ

ITMISCIN

[2]

 

 

 

 

 

nFIQ

ITMISCIN

[1]

 

 

 

 

 

EDBGRQ

ITMISCIN

[0]

 

 

 

 

 

This section describes:

Using the Integration Test Registers

Performing integration testing

ITETMIF Register (ETM interface) on page 13-7

ITMISCOUT Register (Miscellaneous Outputs) on page 13-8

ITMISCIN Register (Miscellaneous Inputs) on page 13-8

Integration Mode Control Register (ITCTRL) on page 13-9

13.4.1Using the Integration Test Registers

When bit [0] of the Integration Mode Control Register (ITCTRL) is set to b1:

Values written to the write-only Integration Test Registers map onto the specified outputs of the macrocell. For example, writing b1 to ITMISCOUT[0] causes DBGACK to be asserted HIGH.

Values read from the read-only Integration Test Registers correspond to the values of the specified inputs of the macrocell. For example, if you read ITMISCIN[9:8] you obtain the value of ETMEXTOUT[1:0].

13.4.2Performing integration testing

When you perform integration testing or topology detection:

You must ensure that the other ETM interface signals cannot change value during integration testing.

ARM strongly recommends that the processor is halted while in debug state, because toggling input and output pins might have an unwanted effect on the operation of the processor. You must not set the ITCTRL Register until the processor has halted.

When the ITCTRL Register is set, the ETM interface stops trace output, and outputs the data written into the relevant integration registers.

After you perform integration testing or topology detection, that is, the Integration Mode Control Register has been set, the system must be reset. This is because the signals that are toggled can have an unwanted effect on connected devices.

ARM DDI 0363E

Copyright © 2009 ARM Limited. All rights reserved.

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ARM R4F, r1p3 manual Using the Integration Test Registers, Performing integration testing