Motorola MCF5281, MCF5282 2lists signals in alphabetical order by abbreviated name, Test Signals

Overview

Table 14-1. MCF5282 Signal Description (Continued)

Signal Name	Abbreviation	Function	I/O	Page
Development serial	DSO/TDO	Provides single-bit communication for	O	14-31
output/Test data		debug module responses (DSO).
		Provides serial data port for outputting
		JTAG logic data (TDO).
Test clock	TCLK	JTAG test logic clock.	I	14-31
Debug data	DDATA[3:0]	Display captured processor	O	14-32
		addresses, data, and breakpoint
		status.
Processor status	PST[3:0]	Indicate core status.	O	14-32
outputs
		Test Signals
Test	TEST	Reserved, should be connected to	I	14-32
		VSS.
	Power and Reference Signals
QADC analog reference	VRH, VRL	High (VRH) and low (VRL) reference	Ground	14-33
		potentials for the analog converter.
QADC analog supply	VDDA, VSSA	Isolate the QADC analog circuitry	I	14-33
		from digital power supply noise.
PLL analog supply	VDDPLL, VSSPLL	Isolate the PLL analog circuitry from	I	14-33
		digital power supply noise.
QADC positive supply	VDDH	Supplies positive power to the ESD	I	14-33
		structures in the QADC pads.
Flash erase/program	VPP	Used for Flash stress testing.	I	14-33
power
Flash array power	VDDF, VSSF	Supply power and ground to Flash	I	14-33
and ground		array.
Standby power	VSTBY	Provides standby voltage to RAM	I	14-33
		array if VDD is lost.
Positive supply	VDD	Supplies positive power to the core	I	14-33
		logic and I/O pads.
Ground	VSS	Negative supply.		14-33

Table 14-2lists signals in alphabetical order by abbreviated name.

MOTOROLA Chapter 14. Signal Descriptions 14-7