Chapter 31

IEEE 1149.1 Test Access Port (JTAG)

The Joint Test Action Group, or JTAG, is a dedicated user-accessible test logic, that complies with the IEEE 1149.1 standard for boundary-scan testability, to help with system diagnostic and manufacturing testing.

This architecture provides access to all data and chip control pins from the board-edge connector through the standard four-pin test access port (TAP) and the JTAG reset pin, TRST.

Figure 31-1shows the block diagram of the JTAG module.

MOTOROLA

Chapter 31. IEEE 1149.1 Test Access Port (JTAG)

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Motorola MCF5281, MCF5282 user manual Chapter Ieee 1149.1 Test Access Port Jtag