Command Dictionary

Analyze Drc Violation

 

 

E9 — The drivers of wire gates must not be capable of driving opposing binary values.

The following lists the Trace rules violation IDs. For a complete description of these violations refer to the “ Scan Chain Trace Rules” section of the Design-for- Test: Common Resources Manual:

T2 — The netlist contains the blocked gate. The pin data shows the values the tool simulates for all time periods of the shift procedure.

T3 — The netlist contains all the gates in the backtrace cone of the blocked gate. The pin data shows the values the tool simulates for all time periods of the shift procedure.

T4 — The netlist contains all the gates in the backtrace cone of the clock inputs of the blocked gate. The pin data shows the values the tool simulates for all time periods of the shift procedure.

T5 T6 — The netlist contains all the gates in the backtrace cone of the clock inputs of the blocked gate. The pin data shows the values the tool simulates for all time periods of the shift procedure.

T7 — The netlist contains all the gates in the path between the two failing latches. The pin data shows the values the tool simulates for all time periods of the shift procedure.

T11 — A clock input of the memory element closest to the scan chain input must not be on during the shift procedure prior to the time of the force_sci statement.

T16 — When clocks and write control lines are off and pin constraints are set, the gate that connects to the input of a reconvergent pulse generator sink (PGS) gate in the long path must be at the non-controlling value of the PGS gate.

T17 — Reconvergent pulse generator sink gates cannot connect to any of the following: primary outputs, non-clock inputs of the scan memory elements, ROM gates, non-write inputs of RAMs and transparent latches.

Examples

The following example defines the off-state of a clock incorrectly, causing a C2 rule violation. When a rule violation occurs, you can use the schematic viewer to analyze the probable cause of the error.

FastScan and FlexTest Reference Manual, V8.6_4

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