Command Dictionary Set Split Capture_cycle
FastScan and FlexTest Reference Manual, V8.6_4 2-583
Set Split Capture_cycle
Tools: FastScan
Scope: All modes
Usage
SET SPlit Capture_cycle ON | OFf
Description
Enables or disables the simulation of level sensitive and leading edge state
elements updating as a result of applied clocks.
The Set Split Capture_cycle enables or disables the simulation of level sensitive
and leading edge state elements having updated as a result of the applied clocks.
This simulation correctly calculates capture values for trailing edge and level
sensitive state elements, even in the presence of C3 violations.
For more information, refer to “Setting Event Simulation (FastScan Only)” in the
Scan and ATPG Process Guide.
Arguments
•ON
A literal that specifies for the tool to set split capture_cycling ON.
•OFf
A literal that specifies for the tool to set split capture_cycling OFF. This is the
default behavior upon invocation of the tool.
Related Commands
Note
This command is not available for RAM sequential simulations.
Since clock sequential ATPG can test the same faults as RAM
sequential, this is not a real limitation.
Set Clock_off Simulation