Command Dictionary | Update Implication Detections |
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Update Implication Detections
Tools Supported: FastScan and FlexTest
Scope: Atpg and Fault modes
Prerequisites: You can use this command when there is an active fault list and you are using the stuck-at fault model.
Usage
UPDate IMplication Detections
Description
Performs an analysis on the undetected and possibly-detected faults to see if the tool can classify any of those faults as detected-by-implication.
By invocation default, the tool only analyzes scan-path-associated faults for the detected-by-implication classification. The tool classifies the following faults as detected-by-implication when you issue the Update Implication Detections command:
∙A stuck-at-1 fault on the set input line of a transparent latch, scan latch, scan D flip-flop, shadow, copy, or sequential cell when the tool detects the stuck-at-1 fault on the output.
∙A stuck-at-1 fault on the reset input line of a transparent latch, scan latch, scan D flip-flop, shadow, copy, or sequential cell when the tool detects the stuck-at-0 fault on the output.
∙A stuck-at-0 fault on a clock input line of a transparent latch, scan latch, scan flip flop, shadow, copy, or sequential cell when the tool detects both the stuck-at-0 and stuck-at-1 faults for the associated data line.
∙A stuck-at-0 fault on a data input line of a transparent latch, scan latch, scan D flip-flop, shadow, copy or sequential cell when the tool detects the stuck- at-0 fault and no other ports can capture a 1.
∙A stuck-at-1 fault on a data input line of a transparent latch, scan latch, scan D flip-flop, shadow, copy, or sequential cell when the tool detects the stuck-at-1 fault on the data output and no other port can capture a 0.
