Mentor v8.6_4 manual Report Testability Data

Report Testability Data Command Dictionary

Report Testability Data

Tools Supported: FastScan and FlexTest

FastScan Scope: Atpg, Fault, and Good modes

FlexTest Scope: Atpg and Fault modes

Usage

REPort TEstability Data -Classclass_type [filename] [-Replace]

Description

Analyzes collapsed faults for the specified fault class and displays the analysis.

The Report Testability Data command identifies and displays any circuitry connections that may cause test coverage problems for the specified fault classes. The display may include any of the following connection types:

∙Tied or blocked by constraints

∙Connected with clock lines

∙Tie-x gates

∙Tri-state-driver enable lines

∙Non-scan latches

∙Non-observable scan latches

∙RAM gates

∙Unresolved wired-gates

∙Primary outputs that connect to clocks

In addition to the above connection types, FlexTest may include the following:

∙Tied latches

∙ROM gates

2-386 FastScan and FlexTest Reference Manual, V8.6_4