Mentor v8.6_4 manual Report Failures

Command Dictionary Report Failures

Report Failures

Tools Supported: FastScan

Scope: Atpg, Good, and Fault modes

Prerequisites: You must specify the current pattern source with the Set Pattern Source command.

Usage

REPort FAIlures [{pin_pathname -Stuck_at {0 1}} [-Max integer] [-Pdet]]

Description

Displays the failing pattern results.

The Report Failures command performs either a good simulation or a fault simulation depending on whether you provide any arguments. If you issue the command without any arguments, the command performs a good machine simulation. If you specify a pin and a stuck-at value, the command performs a fault simulation for those values. In either case the command uses the current pattern source (except random patterns) and displays information on any failing patterns. The command presents the failing patterns information in “scan test” and “chain test” format as follows:

∙“scan test” — For a failing response that occurs during the parallel measure of the primary outputs, the command displays the following two columns:

oThe test pattern number that causes the failure.

oThe pin name of the failing primary output.

∙“chain test” — For a failing response that occurs during the unloading of the scan chain, the command displays the following three columns:

oThe test pattern number that causes the failure.

oThe name of the scan chain where the failing scan cell is located.

FastScan and FlexTest Reference Manual, V8.6_4 2-295