FlexTest Test Pattern File Format | Test Pattern File Formats |
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This command indicates the time in the shift procedure that values are to be measured on the scan chain outputs. The scan chain name will be enclosed in double quotes.
Functional_Chain_Test
If the circuit has scan operation defined for the test pattern set generated by FlexTest, a functional chain test pattern will be included. However, if the test patterns are created by the user, this section is optional. The purpose of the test is to verify the operation of the scan circuitry before it is used to test the other circuitry. For each scan chain group, the functional chain test will simply load a series of zeros and ones into the scan chains and then unload them to verify the operation of the scan circuitry. The format is as follows:
CHAIN_TEST =
APPLY “test_setup” <value> <time>; <scan cycles>
END;
The optional “test_setup” line is applied at the beginning of the functional chain test pattern if there is a test_setup procedure in the Setup_Data section.
The scan cycles will include multiple cycles of the following:
SCAN = <number>;
APPLY “scan_group_unload_name1” <time> =
CHAIN “scan_chain_name1” = | “values...”; |
CHAIN “scan_chain_name2” = | “values...”; |
.... |
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END; |
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APPLY “scan_group_load_name1” | <time> = |
CHAIN “scan_chain_name1” = | “values...”; |
CHAIN “scan_chain_name2” = | “values...”; |
.... |
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END; |
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APPLY “scan_group_unload_name2” <time> = CHAIN “scan_chain_name1” = “values...”; CHAIN “scan_chain_name2” = “values...”;
....
END;
APPLY “scan_group_load_name2” <time> =
FastScan and FlexTest Reference Manual, V8.6_4 |
