Command Dictionary

Add Atpg Constraints

 

 

Add Atpg Constraints

Tools Supported: FastScan and FlexTest

Scope: All modes

Prerequisites: You can use this command only after the tool flattens the design to the simulation model, which happens when you first attempt to exit Setup mode or when you issue the Flatten Model command.

Usage

For FastScan

ADD ATpg Constraints {0 1 Z} {pin_pathname gate_id# function_name {-Cellcell_name {pin_name...}}}... [-Dynamic -Static] [-NOCapclock_check]

For FlexTest

ADD ATpg Constraints {0 1 Z} {pin_pathname net_pathname gate_id#

function_name {-Cellcell_name {{pin_name net_name}...}}}...

[-Dynamic -Static]

Description

Specifies that the tool restrict all patterns it places into the internal pattern set according to the user-defined constraints.

When the tool rejects a simulated pattern, it generates a message indicating the number of rejected patterns and the first gate at which the failure occurred. You can control the severity of the violation with the Set Contention Check command. If you set the checking severity to Error, the tool terminates the simulation if it rejects a pattern due to a user-defined constraint. You can analyze the simulation data up to the termination point by using the Report Gates command with the Error_pattern option.

When either FlexTest generates test patterns or FastScan generates test patterns using deterministic test generation methods, the tool ensures that it uses the user- defined pin constraints. When FastScan generates test patterns randomly, it does not have complete control over the highly automated process, which means that FastScan cannot ensure the use of the user-defined ATPG constraints. However, FastScan will reject non-conforming random patterns.

FastScan and FlexTest Reference Manual, V8.6_4

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Mentor v8.6_4 manual Add Atpg Constraints