Test Pattern File Formats | FlexTest Test Pattern File Format |
|
|
The scan chain definition defines the data associated with a scan chain in the circuit. If there are multiple scan chains within one scan group, each scan chain will have its own independent scan chain definition. The scan chain name will be enclosed in double quotes. The
PROCEDURE <procedure_type> “scan_group_procedure_name” = <list of events>
END;
The type of procedures in each scan group may include shift procedure, load and unload procedure,
FORCE “primary_input_pin” <value> <time>;
This command is used to force a value (0,1, X, or Z) on a selected primary input pin at a given time. The time values must not be lower than previous time values for this command. The primary input pin will be enclosed in double quotes.
APPLY “scan_group_procedure_name” <#times> <time>;
This command indicates the selected procedure name is to be applied the selected number of times beginning at the selected time. The scan group procedure name will be enclosed in double quotes. This command may only be used with the load and unload procedures.
FORCE_SCI “scan_chain_name” <time>;
This command indicates the time in the shift procedure that values are to be placed on the scan chain inputs. The scan chain name will be enclosed in double quotes.
MEASURE_SCO “scan_chain_name” <time>;
FastScan and FlexTest Reference Manual, V8.6_4 |