Mentor v8.6_4 manual 469

Command Dictionary Set Drc Handling

The following lists the Extra rules violation IDs. For a complete description of these violations refer to the “ Extra Rules” section of the Design-for-Test: Common Resources Manual.

E2 — There must be no inversion between adjacent scan cells, the scan chain input pin (SCI) and its adjacent scan cell, and the scan chain output pin (SCO) and its adjacent scan cell.

E3 — There must be no inversion between MASTER and SLAVE for any scan cell.

E4 — Tri-state drivers must not have conflicting values when driving the same net during the application of the test procedures.

E5 — When constrained pins are at their constrained states, and PIs and scan cells are at their specified binary states, X states must not be capable of propagating to an observable point.

E6 — When constrained pins are at their constrained states, the inputs of a gate must not have sensitizable connectivity to more than one memory element of a scan cell.

E7 — External bidirectional drivers must be at the high-impedance (Z) state during the application of the test procedure.

E8 — All masters of all scan-cells within a scan chain must use a single shift clock.

E9 — The drivers of wire gates must not be capable of driving opposing binary values.

E10 — Performs bus contention mutual-exclusivity checking. Similar to E4, but does not check for this condition during test procedures.

E11 — A bus must not be able to attain a Z state.

E12 — The test procedures must not violate any ATPG constraints.

E13 — Satisfy both ATPG constraints and bus contention prevention (for buses that fail rule E10)

The following lists the Trace rules violation IDs. For a complete description of these violations refer to the “ Scan Chain Trace Rules” section of the Design-for- Test: Common Resources Manual:

FastScan and FlexTest Reference Manual, V8.6_4 2-469