Mentor v8.6_4 manual Test Pattern File Formats FastScan Test Pattern File Format

Test Pattern File Formats FastScan Test Pattern File Format

CLOCK “clock_name1” =

OFF_STATE = <off_state_value>;

PULSE_WIDTH = <pulse_width_value>;

END;

CLOCK “clock_name2” =

OFF_STATE = <off_state_value>;

PULSE_WIDTH = <pulse_width_value>;

END;

This defines the list of clocks that are contained in the circuit. The clock data will include the clock name enclosed in double quotes, the off-state value, and the pulse width value. For edge-triggered scan cells, the off-state is the value that places the initial state of the capturing transition at the clock input of the scan cell.

WRITE_CONTROL “primary_input_name” =

OFF_STATE = <off_state_value>;

PULSE_WIDTH = <pulse_width_value>;

END;

This defines the list of write control lines that are contained in the circuit. The write control line will include the primary input name enclosed in double quotes, the off-state value, and the pulse width value. If there are multiple write control lines, they must be pulsed at the same time.

PROCEDURE TEST_SETUP “test_setup” =

FORCE “primary_input_name1” <value> <time>; FORCE “primary_input_name2” <value> <time>;

....

....

END;

This is an optional procedure that can be used to set nonscan memory elements to a constant state for both ATPG and the load/unload process. It is applied once at the beginning of the test pattern set. This procedure may only include force commands.

FastScan and FlexTest Reference Manual, V8.6_4 4-3