Mentor v8.6_4 - page 707

Test Pattern File Formats FastScan Test Pattern File Format
FastScan and FlexTest Reference Manual, V8.6_4 4-3
CLOCK “clock_name1” =
OFF_STATE = <off_state_value>;
PULSE_WIDTH = <pulse_width_value>;
END;
CLOCK “clock_name2” =
OFF_STATE = <off_state_value>;
PULSE_WIDTH = <pulse_width_value>;
END;
This defines the list of clocks that are contained in the circuit. The clock data will
include the clock name enclosed in double quotes, the off-state value, and the
pulse width value. For edge-triggered scan cells, the off-state is the value that
places the initial state of the capturing transition at the clock input of the scan cell.
WRITE_CONTROL “primary_input_name” =
OFF_STATE = <off_state_value>;
PULSE_WIDTH = <pulse_width_value>;
END;
This defines the list of write control lines that are contained in the circuit. The
write control line will include the primary input name enclosed in double quotes,
the off-state value, and the pulse width value. If there are multiple write control
lines, they must be pulsed at the same time.
PROCEDURE TEST_SETUP “test_setup” =
FORCE “primary_input_name1” <value> <time>;
FORCE “primary_input_name2” <value> <time>;
....
....
END;
This is an optional procedure that can be used to set nonscan memory elements to
a constant state for both ATPG and the load/unload process. It is applied once at
the beginning of the test pattern set. This procedure may only include force
commands.