Mentor v8.6_4 manual Set Simulation Mode, Number

Set Simulation Mode Command Dictionary

Set Simulation Mode

Tools Supported: FastScan

Scope: All modes

Usage

SET SImulation Mode Combinational {Ram_sequential [-Random]} [-Depth

number]

Description

Specifies whether the ATPG simulation run uses combinational or sequential RAM test patterns.

The Set Simulation Mode command determines the simulation mode FastScan uses during ATPG. If you specify Ram_sequential for pattern generation, you can further specify the -Random option to force random patterns to also be RAM_sequential. If you do not use the -Random switch, random patterns are combinational.

The -Depth option provides the ability to use clock_sequential cells. It is highly recommended that you select the smallest possible depth, because it affects both memory requirements and performance. When you increase the sequential depth, the tool places all current ATPG untestable faults in the untested fault class. You cannot decrease the sequential depth when there are any active patterns.

If you specify the Ram_sequential option to allow sequential RAM test patterns in the test pattern file, you must operate the sequential RAM simulation mode under the following rules:

1.You may not use ram_sequential patterns with the transition fault type.

2.You may not use ram_sequential patterns with the Set ATPG Compression command, but you may use them with the Compress Patterns command.

3.If you are using external patterns that contain ram_sequential patterns, you must set the simulation mode to Ram_sequential.

2-576 FastScan and FlexTest Reference Manual, V8.6_4