Mentor v8.6_4 manual Analyze fault path37 -s

Command Dictionary Analyze Fault

11.If there were potential detection points, the detection points are identified (25 maximum).

12.A controllability test generation is performed to determine if the fault site can be controlled. If successful, the test generation values is displayed using parallel_pattern 0. If unsuccessful, the analysis then terminates.

13.If an observe point is not selected, a complete test generation is attempted where the fault is sensitized from the fault site to any unblocked point. Potential problem points in any sensitization path are identified. The points will include tri-state driver enable lines, transparent latch data lines, clock_pos, wire gates, latch and flip-flop set/reset/clock lines, RAM write/read/address/data lines, and ROM read/address lines. If the test generation is successful, the test generation values are displayed using parallel_pattern 1.

14.If an observe point is selected, the fault is sensitized from the fault site to the observe point. Potential problem points in the sensitization path are identified. If the sensitization is successful, the test generation values are displayed using parallel_pattern 1.

FastScan Specifics

When the fault type is path delay, the Analyze Fault command performs a false path analysis when the ATPG run is unable to create a test pattern. If the analysis finds that some segment of the path is false, it attempts to find a minimum number of gates in the path which are required to prove the path false.

For example:

analyze fault path37 -s 0

FastScan and FlexTest Reference Manual, V8.6_4 2-139