Command Dictionary Analyze Fault
FastScan and FlexTest Reference Manual, V8.6_4 2-139
11. If there were potential detection points, the detection points are identified
(25 maximum).
12. A controllability test generation is performed to determine if the fault site
can be controlled. If successful, the test generation values is displayed using
parallel_pattern 0. If unsuccessful, the analysis then terminates.
13. If an observe point is not selected, a complete test generation is attempted
where the fault is sensitized from the fault site to any unblocked point.
Potential problem points in any sensitization path are identified. The points
will include tri-state driver enable lines, transparent latch data lines,
clock_pos, wire gates, latch and flip-flop set/reset/clock lines, RAM
write/read/address/data lines, and ROM read/address lines. If the test
generation is successful, the test generation values are displayed using
parallel_pattern 1.
14. If an observe point is selected, the fault is sensitized from the fault site to
the observe point. Potential problem points in the sensitization path are
identified. If the sensitization is successful, the test generation values are
displayed using parallel_pattern 1.
FastScan Specifics
When the fault type is path delay, the Analyze Fault command performs a false
path analysis when the ATPG run is unable to create a test pattern. If the analysis
finds that some segment of the path is false, it attempts to find a minimum number
of gates in the path which are required to prove the path false.
For example:
analyze fault path37 -s 0