Mentor v8.6_4 manual Command Summary

Command DictionaryCommand Summary

Table 2-1. Command Summary [continued]

	D
	F
	T	F	F
Command	I	S	T	Description
Set Possible Credit		∙	∙	Specifies the percentage of credit that the tool
				assigns possible-detected faults.
Set Procedure		∙	∙	Enables test procedure cycle timing checking
Cycle_checking				to be done immediately following scan chain
				tracing during design rules checking.
Set Pulse Generators		∙	∙	Specifies whether the tool identifies pulse
				generator sink (PGS) gates.
Set Race Data			∙	Specifies how FlexTest handles the output
				states of a flip-flop when the data input pin
				changes at the same time as the clock triggers.
Set Rail Strength			∙	Specifies FlexTest to set the strongest strength
				of a fault site to a bus driver.
Set Ram Initialization		∙		Specifies whether to initialize RAM and
				ROM gates that do not have initialization
				files.
Set Ram Test		∙		Specifies the mode for RAM testing with
				random or Built-In Self Test (BIST) patterns.
Set Random Atpg		∙	∙	Specifies whether the tool uses random
				patterns during ATPG.
Set Random Clocks		∙		Specifies whether FastScan uses
				combinational or clock_sequential patterns
				for random pattern simulation.
Set Random Patterns		∙		Specifies the number of random patterns
				FastScan simulates.
Set Random Weights		∙		Specifies the default random pattern
				weighting factor for primary inputs.

FastScan and FlexTest Reference Manual, V8.6_4 2-21