Mentor v8.6_4 - page 44

FastScan and FlexTest Reference Manual, V8.6_4
2-16
Command Summary Command Dictionary
Select Iddq Patterns ••Selects the patterns that most effectively
detect IDDQ faults.
Select Object •••Selects the specified objects in the design.
Set Abort Limit ••Specifies the abort limit for the test pattern
generator.
Set Atpg Compression •Specifies for the ATPG to perform dynamic
pattern compression.
Set Atpg Limits ••Specifies the ATPG process limits at which
the tool terminates the ATPG process.
Set Atpg Window •Allows you to specify the size of the FlexTest
simulation window.
Set AU Analysis •Specifies whether the ATPG uses the ATPG
untestable information to place ATPG
untestable faults directly in the AU fault class.
Set Bist Initialization •Specifies the scan chain input value which
indicates the states of the scan cells before
FastScan applies Built-In Self Test (BIST)
patterns.
Set Bus Handling ••Specifies the bus contention results that you
desire for the identified buses.
Set Bus Simulation •Specifies whether the tool uses global or local
bus simulation analysis.
Set Capture Clock ••Specifies the capture clock name for random
pattern simulation.
Table 2-1. Command Summary [continued]
Command
D
F
T
IF SF TDescription