Mentor v8.6_4 manual Command Summary

Command SummaryCommand Dictionary

Table 2-1. Command Summary [continued]

	D
	F
	T	F	F
Command	I	S	T	Description
Select Iddq Patterns		∙	∙	Selects the patterns that most effectively
				detect IDDQ faults.
Select Object	∙	∙	∙	Selects the specified objects in the design.
Set Abort Limit		∙	∙	Specifies the abort limit for the test pattern
				generator.
Set Atpg Compression		∙		Specifies for the ATPG to perform dynamic
				pattern compression.
Set Atpg Limits		∙	∙	Specifies the ATPG process limits at which
				the tool terminates the ATPG process.
Set Atpg Window			∙	Allows you to specify the size of the FlexTest
				simulation window.
Set AU Analysis		∙		Specifies whether the ATPG uses the ATPG
				untestable information to place ATPG
				untestable faults directly in the AU fault class.
Set Bist Initialization		∙		Specifies the scan chain input value which
				indicates the states of the scan cells before
				FastScan applies Built-In Self Test (BIST)
				patterns.
Set Bus Handling		∙	∙	Specifies the bus contention results that you
				desire for the identified buses.
Set Bus Simulation		∙		Specifies whether the tool uses global or local
				bus simulation analysis.
Set Capture Clock		∙	∙	Specifies the capture clock name for random
				pattern simulation.

2-16 FastScan and FlexTest Reference Manual, V8.6_4