Command DictionaryCommand Summary

Table 2-1. Command Summary [continued]

 

D

 

 

 

 

F

 

 

 

 

T

F

F

 

Command

I

S

T

Description

 

 

 

 

 

 

 

 

Diagnose Failures

 

 

Diagnoses the failing patterns that the

 

 

 

 

specified file identifies.

 

 

 

 

 

Dofile

 

Executes the commands contained within the

 

 

 

 

specified file.

 

 

 

 

 

Exit

 

Terminates the application tool program.

 

 

 

 

 

Extract Subckts

 

Performs matching and conversion between

 

 

 

 

the bi-directional MOS instance and the

 

 

 

 

ATPG library model.

 

 

 

 

 

Flatten Model

 

Creates a primitive gate simulation

 

 

 

 

representation of the design.

 

 

 

 

 

Flatten Subckt

 

Flattens the SUBCKT in the Spice design.

 

 

 

 

 

Help

 

Displays the usage syntax and system mode

 

 

 

 

for the specified command.

 

 

 

 

 

Insert Testability

 

 

Performs testability analysis to achieve

 

 

 

 

maximum test coverage.

 

 

 

 

 

Load Faults

 

Updates the current fault population to

 

 

 

 

include or exclude the faults contained in the

 

 

 

 

specified fault file.

 

 

 

 

 

Load Paths

 

 

Reads into FastScan the path definitions

 

 

 

 

contained in the specified ASCII file.

 

 

 

 

 

Macrotest

 

 

Automates the testing of embedded RAMs or

 

 

 

 

ROMs, embedded hierarchical instances, and

 

 

 

 

embedded blocks of logic with unidirectional

 

 

 

 

I/O.

 

 

 

 

 

Mark

Highlights the objects that you specify in the

 

 

 

 

Schematic View window.

 

 

 

 

 

FastScan and FlexTest Reference Manual, V8.6_4

2-9

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Mentor v8.6_4 manual Command Summary