Test Pattern File Formats

FastScan Test Pattern File Format

 

 

Scan_Cell

The scan_cell section contains the definition of the scan cells used in the circuit. The scan cell data will be in the following format:

SCAN_CELLS =

SCAN_GROUP “group_name1” = SCAN-CHAIN “chain_name1” =

SCAN_CELL = <cellid> <type> <sciinv> <scoinv> <relsciinv> <relscoinv> <instance_name> <model_name> <input_pin> <output_pin>;

....

END;

SCAN_CHAIN “chain_name2” =

SCAN_CELL = <cellid> <type> <sciinv> <scoinv> <relsciinv> <relscoinv> <instance_name> <model_name> <input_pin> <output_pin>;

....

END;

....

END;

....

END;

The fields for the scan cell memory elements are the following:

cellid - A number identifying the position of the scan cell in the scan chain. The number 0 indicates the scan cell closest to the scan-out pin.

type - The type of scan memory element. The type may be MASTER, SLAVE, SHADOW, OBS_SHADOW, COPY, or EXTRA.

sciinv - Inversion of the library input pin of the scan cell relative to the scan chain input pin. The value may be T (inversion) or F (no inversion).

scoinv - Inversion of the library output pin of the scan cell relative to the scan chain output pin. The value may be T (inversion) or F (no inversion).

relsciinv - Inversion of the memory element relative to the library input pin of the scan cell. The value may be T (inversion) or F (no inversion).

FastScan and FlexTest Reference Manual, V8.6_4

4-11

Page 715
Image 715
Mentor v8.6_4 manual ScanCell, Scancells =