Test Pattern File Formats | FastScan Test Pattern File Format |
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Scan_Cell
The scan_cell section contains the definition of the scan cells used in the circuit. The scan cell data will be in the following format:
SCAN_CELLS =
SCAN_GROUP “group_name1” =
SCAN_CELL = <cellid> <type> <sciinv> <scoinv> <relsciinv> <relscoinv> <instance_name> <model_name> <input_pin> <output_pin>;
....
END;
SCAN_CHAIN “chain_name2” =
SCAN_CELL = <cellid> <type> <sciinv> <scoinv> <relsciinv> <relscoinv> <instance_name> <model_name> <input_pin> <output_pin>;
....
END;
....
END;
....
END;
The fields for the scan cell memory elements are the following:
∙cellid - A number identifying the position of the scan cell in the scan chain. The number 0 indicates the scan cell closest to the
∙type - The type of scan memory element. The type may be MASTER, SLAVE, SHADOW, OBS_SHADOW, COPY, or EXTRA.
∙sciinv - Inversion of the library input pin of the scan cell relative to the scan chain input pin. The value may be T (inversion) or F (no inversion).
∙scoinv - Inversion of the library output pin of the scan cell relative to the scan chain output pin. The value may be T (inversion) or F (no inversion).
∙relsciinv - Inversion of the memory element relative to the library input pin of the scan cell. The value may be T (inversion) or F (no inversion).
FastScan and FlexTest Reference Manual, V8.6_4 |
