Test Pattern File Formats FastScan Test Pattern File Format
FastScan and FlexTest Reference Manual, V8.6_4 4-11
Scan_CellThe scan_cell section contains the definition of the scan cells used in the circuit.
The scan cell data will be in the following format:
SCAN_CELLS =
SCAN_GROUP “group_name1” =
SCAN-CHAIN “chain_name1” =
SCAN_CELL = <cellid> <type> <sciinv> <scoinv>
<relsciinv> <relscoinv> <instance_name>
<model_name> <input_pin> <output_pin>;
....
END;
SCAN_CHAIN “chain_name2” =
SCAN_CELL = <cellid> <type> <sciinv> <scoinv>
<relsciinv> <relscoinv> <instance_name>
<model_name> <input_pin> <output_pin>;
....
END;
....
END;
....
END;
The fields for the scan cell memory elements are the following:
•cellid - A number identifying the position of the scan cell in the scan chain.
The number 0 indicates the scan cell closest to the scan-out pin.
•type - The type of scan memory element. The type may be MASTER,
SLAVE, SHADOW, OBS_SHADOW, COPY, or EXTRA.
•sciinv - Inversion of the library input pin of the scan cell relative to the scan
chain input pin. The value may be T (inversion) or F (no inversion).
•scoinv - Inversion of the library output pin of the scan cell relative to the
scan chain output pin. The value may be T (inversion) or F (no inversion).
•relsciinv - Inversion of the memory element relative to the library input pin
of the scan cell. The value may be T (inversion) or F (no inversion).