FastScan and FlexTest Reference Manual, V8.6_4
A-12
SET SPLIT_BIDI_CYCLE TIME Timing Command Dictionary
SET SPLIT_BIDI_CYCLE TIME
Scope: Enables special timing rules checking
Usage
SET SPLIT_BIDI_CYCLE TIME integer
Description
Specifies the period for test procedures and splits the non-scan cycle before the
force or bidi_force time.
Certain tester formats, such as UTIC and Compass Scan, do not allow state
changes on both input pins and bidirectional pins in a single tester cycle. In this
case, you must split each non-scan cycle into two tester cycles. The SET
SPLIT_BIDI_CYCLE TIME command enables the ASICVector Interfaces (AVI)
functionality to split the non-scan test cycle into two tester cycles when writing
patterns.
If you place this command in the timing file, the timing rules checker ensures
compliance to the following conditions:
The timeplate periods are all twice the split_bidi_cycle time.
The period of all scan test procedures equals the split_bidi_cycle time
multiplied by the number of cycles in the test procedure.
The super timeplate contains a bidi_force_pi event.
The split_bidi_cycle time is greater than the force_pi time and less than or
equal to the bidi_force_pi time in the super timeplate.
The timing of each timeplate is compatible with the super timeplate. For
example, the force_pi time in each timeplate should occur at the same time
as in the super timeplate.
For each scan test procedure, each force event time on a clock pin
corresponds to the split_bidi_cycle time minus the super timeplate clock
force times.