Report Gates

Command Dictionary

 

 

Table 2-5. FastScan Clock Port Categories

Category

Description

 

 

IL

inactive low

 

 

IH

inactive high

 

 

AHS

active high slave

 

 

ALS

active low slave

 

 

For more information on using the clock port options, refer to “ The ATPG Analysis Option” of the Design-for-Test: Common Resources Manual.

Examples

The following example displays the simulated values of the gate and its inputs at the primitive level:

set system mode atpg

set gate report error_pattern set gate level primitive report gates i_1006/o

The gate report for the design level may look like the following:

/P2.13P ND2

AI /LD.1

BI /M1.1

Z

O /P2.2P/S

The gate report for the primitive level may look like the following:

/P2.13P (23) NAND

AI 9-/LD.1

BI 6-/M1.1

Z O 33-/P2.2P/S

For FastScan the gate report for the primitive level of a RAM gate may look like the following:

///P1.RAM/U1 (67) RAM

//"I0" I 27-

//"I1" I 20-

//RCK0 I 36-

//"I3" I 26-

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FastScan and FlexTest Reference Manual, V8.6_4

Page 352
Image 352
Mentor v8.6_4 manual FastScan Clock Port Categories, Category Description