FastScan and FlexTest Reference Manual, V8.6_4
2-140
Analyze Fault Command Dictionary
Produces the following report:
// --------------------------------------------------------
// Path delay fault analysis for path37 slow to rise on
launch point = 22032,
capture point = 167521
// ---------------------------------------------------------
// Path delay test generation not successful for capture
point = 167521 due to
atpg_untestable.
// Begin false path analysis for path=path37
// Cycle=0 path sensitisation check failed status=redundant
// Simultaneous sensitisation of 2 path segments cannot be
achieved
(status=redundant).
// These are:
// OR 145279 (I1) + ;
// ...
// AND 150252 (I1) + ;
// Path is a static false path. Robust detection will be
impossible.
The analyze fault report shows that it is impossible to use both input 1 (the second
input, inputs are numbered starting at 0) of the OR gate 145279 while at the same
time using input 1 of the AND gate 150252. The ellipsis (...) indicates that there
are other gates in the path between the reported gates which are not relevant to the
false path problem.
The Delete Paths -False_paths command allows you to delete proven false paths.
Arguments
•pin_pathname
A required string that specifies the pin name of the fault where you want to
perform the analysis.
•-Stuck_at 0 | 1
A required switch and literal pair that specifies the stuck-at fault value that you
want to analyze. The stuck-at values are as follows:
0 — A literal that specifies that the tool analyze the pin_pathname for a
“stuck-at-0” fault.