FastScan and FlexTest Reference Manual, V8.6_4
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Set Bist Initialization Command Dictionary
Set Bist Initialization
Tools Supported: FastScan
Scope: All modes
Usage
SET BIst Initialization {0 | 1}
Description
Specifies the scan chain input value which indicates the states of the scan cells
before FastScan applies Built-In Self Test (BIST) patterns.
The Set BIST Initialization command defines the value on the scan chain inputs
which, when FastScan loads the scan chains, causes the scan cells to have
particular (initial) values. FastScan loads the scan chains using this input value
during the simulation of BIST patterns. Then, just prior to the first BIST pattern,
FastScan unloads the scan cell values (in the form of the scan chain contents) into
the Multiple Input Signature Register (MISR).
Once FastScan initializes the MISR, the BIST simulation continues as normal:
1. Load a pseudo-random pattern via the scan path.
2. Generate and apply a new pseudo-random test pattern to the primary inputs.
3. Capture the response into the scan cells.
4. Load the response from the scan cells to the MISR.
You use this command primarily for simulating Built-In Self Test (BIST)
circuitry.
Arguments
•0
A literal that sets the scan chain input line to a 0, which in turn initializes the
scan cells to a 0. This is the invocation default value.