Report Test Stimulus

Command Dictionary

 

 

Report Test Stimulus

Tools Supported: FastScan

Scope: Atpg, Fault, and Good modes

Usage

REPort TEst Stimulus -Set{{id# pin_pathname} {0 1 Z}}...

-Write{{id# RAM_instance_name} [address_values] [data_values]}...

-Read{{id# RAM_instance_name} [address_values]}...

-RWx{{id# RAM_instance_name} [address_values]}...

-SENsitize{{id# RAM_instance_name pin_pathname}

[-Observe {id# pin_pathname}][-Expect {0 1 X Z}...]}...

[-Port port_id#] [-Verbose -Noverbose] [-PRevious] [-STore]

Description

Displays the stimulus necessary to satisfy the specified set, write, or read conditions.

You use the Report Test Stimulus command to identify how to sensitize scan chain blockage points. For example, if you first delete all scan groups and then go to the ATPG system mode, you can issue the Report Test Stimulus command for possible conditions to satisfy sensitization. That is, if the blockage was at an AND gate, you might try to set an input of the gate to 1.

If the test generation is not successful, the command displays a message indicating why. The reason may be that the test was aborted, redundant, or ATPG untestable.

If the test generation is successful, the command displays the stimulus necessary to satisfy the specified conditions. The display identifies the stimulus for scan cells by the gate index number, instance name, and cell ID number of the scan chain.

You can access the simulated values for internal gates by using the Set Gate Report command with a parallel_pattern of 0.

Arguments

-Setid# pin_pathname 0 1 Z

A switch with a repeatable argument and literal pair that specifies the pin and its value for which you want to generate the appropriate stimulus. You may

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FastScan and FlexTest Reference Manual, V8.6_4

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Mentor v8.6_4 manual Report Test Stimulus, ∙ -Setid# pinpathname 0 1 Z