Mentor v8.6_4 manual Macrotest, ∙ Id#

Macrotest Command Dictionary

Macrotest

Tools Supported: FastScan

Scope: All modes

Usage

MACrotest {[ID# pin_pathname instance_name] pattern_filename [-MULtiple_macrosmacro_filename]}

[-FIll_patterns -NO_FIll_patterns] [-FAultsim -NOFAultsim] [-Verbose -NOVerbose] [-L_h -NO_L_h] [-MAX_Orderings d] [-Det_observe -RAndom_observe [-MAX_Path_attempts d]] [-Parity parity_file_name [-REplace]] [-NOVERIfy_observability -VERIfy_observability]

Description

Automates the testing of embedded RAMs or ROMs, embedded hierarchical instances, and embedded blocks of logic with unidirectional I/O.

For example, a sequential block may be reused, with added combinational logic on its inputs, outputs, or both (to MUX in other functions, etc.). Or perhaps a RAM marching test is to be applied to a small embedded RAM or a register file. In these cases, the tests for the nonembedded logic are already known or generated, but they need to be converted for use in the embedded environment.

For more information on Macrotest, refer to Using FastScan’s Macrotest Capability in the Scan and ATPG Process Guide.

Arguments

∙ID#

An non-repeatable integer that specifies the gate identification number of the object to use in the macrotest. The value of the gate_id# argument is the unique identification number that the tool automatically assigns to every gate within the design during the model flattening process.

∙pin_pathname

A non-repeatable string that specifies the name of the output pin of an ATPG library model that you want to use in the macrotest.

2-242 FastScan and FlexTest Reference Manual, V8.6_4