About This Manual | Acronyms Used in This Manual |
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Acronyms Used in This Manual
Below is an alphabetical listing of the acronyms used in this manual: ASIC - Application Specific IC
ATE - Automatic Test Equipment
ATPG - Automatic Test Pattern Generation
AU - ATPG_Untestable fault
AVI - ASIC Vector Interfaces
BIST -
BSDA - Boundary Scan Design Architect
BSDL - Boundary Scan Design Language
CUT - Circuit Under Test
DFT - Design For Test
DFTA - DFTAdvisor
DFTI - DFTInsight
DRC - Design Rules Check
DUT - Device Under Test
EDDM - Electronic Design Data Model
EDIF - Electronic Design Interchange Format
FS - FastScan
FT - FlexTest
FastScan and FlexTest Reference Manual, V8.6_4 | xxi |
