Table of Contents

TABLE OF CONTENTS [continued]

Compress Patterns

2-149

Create Initialization Patterns

2-152

Create Patterns

2-154

Delete Atpg Constraints

2-156

Delete Atpg Functions

2-158

Delete Capture Handling

2-160

Delete Cell Constraints

2-162

Delete Clocks

2-164

Delete Cone Blocks

2-165

Delete Control Points

2-167

Delete Display Instances

2-169

Delete Faults

2-171

Delete Iddq Constraints

2-174

Delete Initial States

2-176

Delete LFSR Connections

2-177

Delete LFSR Taps

2-179

Delete LFSRs

2-181

Delete Lists

2-183

Delete Mos Direction

2-184

Delete Net Property

2-185

Delete Nofaults

2-186

Delete Nonscan Handling

2-189

Delete Notest Points

2-191

Delete Observe Points

2-193

Delete Output Masks

2-195

Delete Paths

2-197

Delete Pin Constraints

2-199

Delete Pin Equivalences

2-201

Delete Pin Strobes

2-202

Delete Primary Inputs

2-204

Delete Primary Outputs

2-206

Delete Random Weights

2-208

Delete Read Controls

2-210

Delete Scan Chains

2-211

Delete Scan Groups

2-212

FastScan and FlexTest Reference Manual, V8.6_4

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Mentor v8.6_4 manual Table of Contents