FastScan and FlexTest Reference Manual, V8.6_4
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Write Failures Command Dictionary
Write Failures
Tools Supported: FastScan
Scope: Atpg, Fault, and Good modes
Prerequisites: You must specify the current pattern source with the Set Pattern
Source command. The pattern source cannot be random.
Usage
WRIte FAIlures failure_filename [-Replace] [{pin_pathname -Stuck_at {0 | 1}}
[-Max integer] [-Pdet]]
Description
Writes failing pattern results to a file.
The Write Failures command outputs the same information as the Report Failures
command except that FastScan writes it to the file that you specify rather than to
the session transcript.
The Write Failures command performs either a good simulation or a fault
simulation depending on whether you provide any arguments. If you issue the
command without any arguments, the command performs a good machine
simulation. If you specify a pin and a stuck-at value, the command performs a
fault simulation for those values. In either case, the command uses the current
pattern source (except random patterns) and displays information on any failing
patterns. The command presents the failing patterns information in “scan test” and
“chain test” format as follows:
•“scan test” — For a failing response that occurs during the parallel measure
of the primary outputs, the command displays the following two columns:
oThe test pattern number that causes the failure.
oThe pin name of the failing primary output.
•“chain test” — For a failing response that occurs during the unloading of
the scan chain, the command displays the following three columns:
oThe test pattern number that causes the failure.