Mentor v8.6_4 manual Write Failures

Write Failures Command Dictionary

Write Failures

Tools Supported: FastScan

Scope: Atpg, Fault, and Good modes

Prerequisites: You must specify the current pattern source with the Set Pattern Source command. The pattern source cannot be random.

Usage

WRIte FAIlures failure_filename [-Replace] [{pin_pathname -Stuck_at {0 1}} [-Max integer] [-Pdet]]

Description

Writes failing pattern results to a file.

The Write Failures command outputs the same information as the Report Failures command except that FastScan writes it to the file that you specify rather than to the session transcript.

The Write Failures command performs either a good simulation or a fault simulation depending on whether you provide any arguments. If you issue the command without any arguments, the command performs a good machine simulation. If you specify a pin and a stuck-at value, the command performs a fault simulation for those values. In either case, the command uses the current pattern source (except random patterns) and displays information on any failing patterns. The command presents the failing patterns information in “scan test” and “chain test” format as follows:

∙“scan test” — For a failing response that occurs during the parallel measure of the primary outputs, the command displays the following two columns:

oThe test pattern number that causes the failure.

oThe pin name of the failing primary output.

∙“chain test” — For a failing response that occurs during the unloading of the scan chain, the command displays the following three columns:

oThe test pattern number that causes the failure.

2-634 FastScan and FlexTest Reference Manual, V8.6_4