Mentor v8.6_4 manual ScanCell

FlexTest Test Pattern File Format Test Pattern File Formats

An event in a normal test cycle can be a force event, or measure event. All events have to have correct timing order, as defined by the Add Pin Constraints and Add Pin Strobes commands.

The format of a force event is as follows.

FORCE “ibus_name” “primary_input_values” <time>;

A force event is used to force values on the selected primary input pins at the given time unit within the specified test cycle. The name is either a primary input name or a input bus name defined in Setup_Data part, and is enclosed in double quotes. The values will also be enclosed in double quotes. If a bus name is used, the values will be in a one-to-one correspondence with the order of the specified primary inputs in Setup_Data part.

The format of a measure event is as follows.

MEASURE “obus_name” “primary_output_values” <time>;

A measure event is used to measure the value of the selected primary output pins at the given time unit within the specified test cycle. The name is either a primary output name or an output bus name defined in Setup_Data part, and is enclosed in double quotes. The values will also be enclosed in double quotes. If a bus name is used, the values will be in a one-to-one correspondence with the order of the specified primary outputs in Setup_Data part.

If the test set contains patterns for IDDQ testing, an additional measure event will be listed for IDDQ patterns. The format of the IDDQ measure event is as follows.

MEASURE IDDQ ALL <time>:

Scan_Cell

The scan_cell section contains the definition of the scan cells used in the circuit. The scan cell data will be in the following format:

SCAN_CELLS =

SCAN_GROUP “group_name1” = SCAN_CHAIN “chain_name1” =

SCAN_CELL = <cellid> <type> <sciinv> <scoinv> <relsciinv>

4-18 FastScan and FlexTest Reference Manual, V8.6_4