Command Dictionary Set Pattern Source
FastScan and FlexTest Reference Manual, V8.6_4 2-547
In ATPG system mode, you can use this option to create patterns for random
pattern testable faults. In Fault mode, you can use this option to evaluate the
expected random pattern test coverage.
•Bist (FastScan Only)
A literal that specifies for the tool to use the Built-In Self Test (BIST) patterns
when performing a simulation run.
Before executing the run, FastScan checks to ensure that there is at least one
defined LFSR. The existence of such an LFSR means that the design
successfully passed the BIST rules checking when leaving Setup. FastScan
displays an error condition if this check fails.
When you specify BIST patterns, you may use the Store_patterns option to
store the BIST patterns when simulating in Good system mode. These
patterns are different from normal patterns in that they specify the excess
values that occur on short scan chains during the load and unload process.
Also, the last pattern will not contain an unload of the scan chains.
•External filename
A literal and string pair that specifies for the tool to use the external set of
patterns contained in the filename you specify when performing a simulation
run.
For FastScan, the external patterns can be in either ASCII test pattern format or
binary format.
For FlexTest, the external patterns can be in either ASCII test pattern format,
table format, or VCD (Value Change Dump) pattern file format. If filename
contains external patterns in table format, you must also use the -Table option.
If filename is a VCD pattern file, you must use the -Vcd option AND specify a
control_filename by using the -Control option.
The external pattern formats are described in Chapter 4,Test Pattern File
Formats.
•-Ascii
An optional switch specifying that the External test pattern set is in ASCII
format. This is the default for FlexTest.
You cannot use this option with the Internal pattern source.