Add Pin Constraints | Command Dictionary |
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FlexTest Specifics:
If the value of the pins change during the scan operation, FlexTest uses the
R0 period offset width (FlexTest Only) — A literal and three integer quadruplet that specifies application of one positive pulse per period.
SR0 period offset width (FlexTest Only) — A literal and three integer quadruplet that specifies application of one suppressible positive pulse during
CR0 period offset width (FlexTest Only) — A literal and three integer quadruplet that specifies no positive pulse during
CR0 (FastScan Only) — A literal that specifies a constant that returns to 0; FastScan uses this constant only when formatting the patterns. The ATPG process treats CR0 as a C0.
R1 period offset width (FlexTest Only) — A literal and three integer quadruplet that specifies application of one negative pulse per specified period during
SR1 period offset width (FlexTest Only) — A literal and three integer quadruplet that specifies application of one suppressible negative pulse.
CR1 period offset width (FlexTest Only) — A literal and three integer quadruplet that specifies no negative pulse during
CR1 (FastScan Only)— A literal that specifies a constant that returns to 1; FastScan uses this constant only when formatting the patterns. The ATPG process treats CR1 as a C1.
Where:
period (FlexTest Only) — An integer that specifies the period in terms of the total number of test cycles. The Set Test Cycle command defines the number of timeframes per test cycle.
offset (FlexTest Only) — An integer that specifies the timeframe in which values start to change in each cycle.
width (FlexTest Only) — An integer that specifies the pulse width of the pulse type waveform in number of timeframes.
FastScan and FlexTest Reference Manual, V8.6_4 |