Command Dictionary Set Atpg Limits
FastScan and FlexTest Reference Manual, V8.6_4 2-431
integer — A positive integer that specifies the maximum number of CPU
seconds that the tool can consume during an ATPG process. When the tool
reaches the maximum, it terminates the ATPG process.
-Test_coverage OFf | real
An optional switch and argument pair that specifies the maximum percentage
of test coverage that any future ATPG process need reach before the tool
terminates the process. The argument choices are as follows:
OFf — A literal specifying the 100 percent test coverage limit during an
ATPG process. The tool terminates the ATPG process when either 100
percent coverage is attained or when the ATPG process has completed.
This is the invocation default.
real — A positive real number that specifies the maximum percentage of
test coverage that the tool should achieve during an ATPG process. When
the tool reaches the maximum, it terminates the ATPG process.
-Pattern_count OFf | integer (FastScan Only)
An optional switch and argument pair that specifies the maximum number of
test patterns that any future ATPG process can generate before FastScan
terminates the process. The argument choices are as follows:
OFf — A literal specifying that there is no limit to the number of test
patterns the ATPG process generates during an ATPG process. This is the
invocation default.
integer — A positive integer that specifies the maximum number of test
patterns that FastScan can generate during an ATPG process. When
FastScan reaches the maximum, it terminates the ATPG process.
-Cycle_count OFf | integer (FlexTest Only)
An optional switch and argument pair that specifies the maximum number of
cycles that any future ATPG process can use before FlexTest terminates the
process. The argument choices are as follows:
OFf — A literal specifying that there is no limit to the number of test cycles
the ATPG process uses during an ATPG process. This is the invocation
default.
integer — A positive integer that is greater than, or equal to, the current
number of internal patterns and that specifies the maximum number of test