FlexTest Test Pattern File Format | Test Pattern File Formats |
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∙relscoinv - Inversion of the memory element relative to the library output pin of the scan cell. The value may be T (inversion) or F (no inversion).
∙instance_name - The top level boundary instance name of the memory element in the scan cell.
∙model_name - The internal instance pathname of the memory element in the scan cell (if used - blank otherwise).
∙input_pin - The library input pin of the scan cell (if it exists, blank otherwise).
∙output_pin - The library output pin of the scan cell (if it exists, blank otherwise).
FlexTest Test Pattern File Format
FlexTest can read in two types of pattern formats: ASCII and table. This section describes the contents of both formats.
ASCII Pattern Format
The ASCII file describing the test patterns is divided into four sections, which are named setup_data, functional_chain_test, test_data, and scan_cell. Each section begins with a section name statement and finishes with an end statement. The format of the data contained in each section is described as follows. Also in this file, any line starting with a double slash (//) is a comment line.
Setup_Data
The setup_data section contains the definition of the test cycle width, the primary input bus, and the primary output bus that will be referenced in the description of the test patterns. This section will also contain any scan chain information, if there are any scan chains defined in the circuit. The data will be in the following format:
SETUP =
<setup information> END;
FastScan and FlexTest Reference Manual, V8.6_4 |
