FastScan and FlexTest Reference Manual, V8.6_4
4-12
FlexTest Test Pattern File Format Test Pattern File Formats
•relscoinv - Inversion of the memory element relative to the library output
pin of the scan cell. The value may be T (inversion) or F (no inversion).
•instance_name - The top level boundary instance name of the memory
element in the scan cell.
•model_name - The internal instance pathname of the memory element in
the scan cell (if used - blank otherwise).
•input_pin - The library input pin of the scan cell (if it exists, blank
otherwise).
•output_pin - The library output pin of the scan cell (if it exists, blank
otherwise).
FlexTest Test Pattern File Format
FlexTest can read in two types of pattern formats: ASCII and table. This section
describes the contents of both formats.

ASCII Pattern Format

The ASCII file describing the test patterns is divided into four sections, which are
named setup_data, functional_chain_test, test_data, and scan_cell. Each section
begins with a section name statement and finishes with an end statement. The
format of the data contained in each section is described as follows. Also in this
file, any line starting with a double slash (//) is a comment line.
Setup_Data
The setup_data section contains the definition of the test cycle width, the primary
input bus, and the primary output bus that will be referenced in the description of
the test patterns. This section will also contain any scan chain information, if there
are any scan chains defined in the circuit. The data will be in the following format:
SETUP =
<setup information>
END;