Index
FastScan and FlexTest Reference Manual, V8.6_4 Index-1
A
About This Manual, xvii
Acronyms, xxi
ASCII Pattern Format
Functional Chain Test, 4-16
Scan Cell, 4-18
Setup Data, 4-12
Test Data, 4-17
C
Commands
Abort Interrupted Process, 2-28
Add Ambiguous Paths, 2-29
Add Atpg Constraints, 2-31
Add Atpg Functions, 2-36
Add Capture Handling, 2-40
Add Cell Constraints, 2-43
Add Cell Library, 2-46
Add Clocks, 2-47
Add Cone Blocks, 2-49
Add Control Points, 2-51
Add Display Instances, 2-53
Add Display Loop, 2-57
Add Display Path, 2-60
Add Display Scanpath, 2-63
Add Faults, 2-66
Add Iddq Constraints, 2-68
Add Initial States, 2-70
Add LFSR Connections, 2-72
Add LFSR Taps, 2-74
Add LFSRs, 2-76
Add Lists, 2-79
Add Mos Direction, 2-81
Add Net Property, 2-83
Add Nofaults, 2-84
Add Nonscan Handling, 2-87
Add Notest Points, 2-89
Add Observe Points, 2-90
Add Output Masks, 2-92
Add Pin Constraints, 2-93
Add Pin Equivalences, 2-98
Add Pin Strobes, 2-101
Add Primary Inputs, 2-103
Add Primary Outputs, 2-105
Add Random Weights, 2-106
Add Read Controls, 2-108
Add Scan Chains, 2-110
Add Scan Groups, 2-112
Add Scan Instances, 2-114
Add Scan Models, 2-115
Add Slow Pad, 2-116
Add Tied Signals, 2-117
Add Write Controls, 2-119
Analyze Bus, 2-123
Analyze Control, 2-126
Analyze Control Signals, 2-128
Analyze Drc Violation, 2-131
Analyze Fault, 2-137
Analyze Observe, 2-143
Analyze Race, 2-145
B, 2-312
Close Schematic Viewer, 2-148
Compress Patterns, 2-149
Create Initialization Patterns, 2-152
Create Patterns, 2-154
Delete Atpg Constraints, 2-156
Delete Atpg Functions, 2-158
Delete Capture Handling, 2-160
Delete Cell Constraints, 2-162
Delete Clocks, 2-164
Delete Cone Blocks, 2-165
Delete Control Points, 2-167
Delete Display Instances, 2-169
Delete Faults, 2-171
Delete Iddq Constraints, 2-174
Delete Initial States, 2-176
Delete LFSR Connections, 2-177
Delete LFSR Taps, 2-179
Delete LFSRs, 2-181
Delete Lists, 2-183
INDEX