Index

A

About This Manual, xvii Acronyms, xxi

ASCII Pattern Format Functional Chain Test, 4-16Scan Cell, 4-18

Setup Data, 4-12

Test Data, 4-17

C

Commands

Abort Interrupted Process, 2-28

Add Ambiguous Paths, 2-29

Add Atpg Constraints, 2-31

Add Atpg Functions, 2-36

Add Capture Handling, 2-40

Add Cell Constraints, 2-43

Add Cell Library, 2-46

Add Clocks, 2-47

Add Cone Blocks, 2-49

Add Control Points, 2-51

Add Display Instances, 2-53

Add Display Loop, 2-57

Add Display Path, 2-60

Add Display Scanpath, 2-63

Add Faults, 2-66

Add Iddq Constraints, 2-68

Add Initial States, 2-70

Add LFSR Connections, 2-72

Add LFSR Taps, 2-74

Add LFSRs, 2-76

Add Lists, 2-79

Add Mos Direction, 2-81

Add Net Property, 2-83

Add Nofaults, 2-84

Add Nonscan Handling, 2-87

Add Notest Points, 2-89

Add Observe Points, 2-90

Add Output Masks, 2-92

Add Pin Constraints, 2-93

INDEX

Add Pin Equivalences, 2-98

Add Pin Strobes, 2-101

Add Primary Inputs, 2-103

Add Primary Outputs, 2-105

Add Random Weights, 2-106

Add Read Controls, 2-108

Add Scan Chains, 2-110

Add Scan Groups, 2-112

Add Scan Instances, 2-114

Add Scan Models, 2-115

Add Slow Pad, 2-116

Add Tied Signals, 2-117

Add Write Controls, 2-119

Analyze Bus, 2-123

Analyze Control, 2-126

Analyze Control Signals, 2-128

Analyze Drc Violation, 2-131

Analyze Fault, 2-137

Analyze Observe, 2-143

Analyze Race, 2-145

B, 2-312

Close Schematic Viewer, 2-148

Compress Patterns, 2-149

Create Initialization Patterns, 2-152

Create Patterns, 2-154

Delete Atpg Constraints, 2-156

Delete Atpg Functions, 2-158

Delete Capture Handling, 2-160

Delete Cell Constraints, 2-162

Delete Clocks, 2-164

Delete Cone Blocks, 2-165

Delete Control Points, 2-167

Delete Display Instances, 2-169

Delete Faults, 2-171

Delete Iddq Constraints, 2-174

Delete Initial States, 2-176

Delete LFSR Connections, 2-177

Delete LFSR Taps, 2-179

Delete LFSRs, 2-181

Delete Lists, 2-183

FastScan and FlexTest Reference Manual, V8.6_4

Index-1

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Mentor v8.6_4 manual Index