Index
A
About This Manual, xvii Acronyms, xxi
ASCII Pattern Format Functional Chain Test,
Setup Data,
Test Data,
C
Commands
Abort Interrupted Process,
Add Ambiguous Paths,
Add Atpg Constraints,
Add Atpg Functions,
Add Capture Handling,
Add Cell Constraints,
Add Cell Library,
Add Clocks,
Add Cone Blocks,
Add Control Points,
Add Display Instances,
Add Display Loop,
Add Display Path,
Add Display Scanpath,
Add Faults,
Add Iddq Constraints,
Add Initial States,
Add LFSR Connections,
Add LFSR Taps,
Add LFSRs,
Add Lists,
Add Mos Direction,
Add Net Property,
Add Nofaults,
Add Nonscan Handling,
Add Notest Points,
Add Observe Points,
Add Output Masks,
Add Pin Constraints,
INDEX
Add Pin Equivalences,
Add Pin Strobes,
Add Primary Inputs,
Add Primary Outputs,
Add Random Weights,
Add Read Controls,
Add Scan Chains,
Add Scan Groups,
Add Scan Instances,
Add Scan Models,
Add Slow Pad,
Add Tied Signals,
Add Write Controls,
Analyze Bus,
Analyze Control,
Analyze Control Signals,
Analyze Drc Violation,
Analyze Fault,
Analyze Observe,
Analyze Race,
B,
Close Schematic Viewer,
Compress Patterns,
Create Initialization Patterns,
Create Patterns,
Delete Atpg Constraints,
Delete Atpg Functions,
Delete Capture Handling,
Delete Cell Constraints,
Delete Clocks,
Delete Cone Blocks,
Delete Control Points,
Delete Display Instances,
Delete Faults,
Delete Iddq Constraints,
Delete Initial States,
Delete LFSR Connections,
Delete LFSR Taps,
Delete LFSRs,
Delete Lists,
FastScan and FlexTest Reference Manual, V8.6_4 |