FastScan Test Pattern File Format | Test Pattern File Formats |
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Scan_Test
The scan_test section contains the definition of the scan test patterns that were created by the FastScan program. A scan pattern will normally include the following:
SCAN_TEST =
PATTERN = <number>;
FORCE “PI” “primary_input_values” <time>; APPLY “scan_group_load_name” <time> =
CHAIN “scan_chain_name1” = “values....”;
CHAIN “scan_chain_name2” = “values....”;
....
....
END;
FORCE “PI” “primary_input_values” <time>; MEASURE “PO” “primary_output_values” <time>; PULSE “capture_clock_name1” <time>;
PULSE “capture_clock_name2” <time>; APPLY “scan_group_unload_name” <time> =
CHAIN “scan_chain_name1” = “values....”;
CHAIN “scan_chain_name2” = “values....”;
....
....
END;
....
....
....
END;
The number of the pattern represents the pattern number in which the scan chain is loaded, values are placed and measured, any capture clock is pulsed, and the scan chain is unloaded. The pattern number is
FastScan and FlexTest Reference Manual, V8.6_4 |