Mentor v8.6_4 manual Testsetup information is as follows

FlexTest Test Pattern File Format Test Pattern File Formats

The test_setup information is as follows:

PROCEDURE TEST_SETUP “test_setup” =

FORCE “primary_input_name1” <value> <time>; FORCE “primary_input_name2” <value> <time>;

....

....

END;

This procedure must be identical to the test_setup procedure in the Test Procedure file. This procedure is used to set non-scan memory elements to a constant state for both ATPG and the load/unload process. It is applied once at the beginning of the test pattern set. This procedure may only include force commands.

The scan group information is as follows:

SCAN_GROUP “scan_group_name1” = <scan_group_information>

END;

SCAN_GROUP “scan_group_name2” = <scan_group_information>

END;

This defines each scan group that is contained in the circuit. A scan chain group is a set of scan chains that are loaded and unloaded in parallel. The scan group name will be enclosed in double quotes and each scan group will have its own independent scan group section. Within a scan group section, there is information associated with that scan group, such as scan chain definitions and procedures. Any scan groups listed in the test pattern file must be defined with Add Scan Groups command.

SCAN_CHAIN “scan_chain_name1” =

SCAN_IN = <scan_in_pin>;

SCAN_OUT = <scan_out_pin>;

LENGTH = <length_of_scan_chain>;

END;

SCAN_CHAIN “scan_chain_name2” =

SCAN_IN = <scan_in_pin>;

SCAN_OUT = <scan_out_pin>;

LENGTH = <length_of_scan_chain>;

END;

4-14 FastScan and FlexTest Reference Manual, V8.6_4