Mentor v8.6_4 Chapter 1 Introduction

FastScan and FlexTest Reference Manual, V8.6_4 1-1
Chapter 1
Introduction
FastScan and FlexTest are Mentor Graphics high-performance Automatic Test
Pattern Generation (ATPG) tools. FastScan performs full-scan and scan-
sequential ATPG, while FlexTest performs sequential ATPG. These are two of
several tools in the Mentor Graphics Design-for-Test (DFT) tool suite. The
following subsections list the features and inputs/outputs of the tools. For
information on using FastScan or FlexTest in the context of a DFT flow, refer to
the “Generating Test Patterns” chapter in the Scan and ATPG Process Guide.
Features
FastScan and FlexTest share numerous features, including the following:
•You can use them within a Mentor Graphics flow or as a point tool within
other design flows.
•Contain an internal high-speed fault simulator.
•Read most standard gate-level netlists.
•Produce a number of standard test pattern data formats.
•Contain a powerful design rules checker.
FastScan-specific features include the following:
•Produces very high coverage test pattern sets for full-scan and scan-
sequential designs. Scan-sequential designs contain well-behaved
sequential scan circuitry, including non-scan latches, sequential memories,
and limited sequential depth.