Chapter 1
Introduction
FastScan and FlexTest are Mentor Graphics high-performance Automatic Test Pattern Generation (ATPG) tools. FastScan performs full-scan and scan- sequential ATPG, while FlexTest performs sequential ATPG. These are two of several tools in the Mentor Graphics Design-for-Test (DFT) tool suite. The following subsections list the features and inputs/outputs of the tools. For information on using FastScan or FlexTest in the context of a DFT flow, refer to the “ Generating Test Patterns” chapter in the Scan and ATPG Process Guide.
Features
FastScan and FlexTest share numerous features, including the following:
∙You can use them within a Mentor Graphics flow or as a point tool within other design flows.
∙Contain an internal high-speed fault simulator.
∙Read most standard gate-level netlists.
∙Produce a number of standard test pattern data formats.
∙Contain a powerful design rules checker.
FastScan-specific features include the following:
∙Produces very high coverage test pattern sets for full-scan and scan- sequential designs. Scan-sequential designs contain well-behaved sequential scan circuitry, including non-scan latches, sequential memories, and limited sequential depth.
FastScan and FlexTest Reference Manual, V8.6_4 | 1-1 |
