Mentor v8.6_4 manual 288

Report Drc Rules Command Dictionary

D3 — The netlist contains all the gates in the backtrace cone of the failing gate. The pin data shows the values the tool simulates for all time periods of the master_observe procedure.

D4 — The netlist contains all the gates in the backtrace cone of the failing gate. The pin data shows the values the tool simulates for all time periods of the skew_load procedure.

D5 — The netlist contains the disturbed gate, and there is no pin data.

D6 D7 D8 — The netlist contains all the gates in the backtrace cone of the clock inputs of the failing gate. The pin data shows the value that the tool simulates when all clocks are at their off-states.

D9 — The netlist contains all the gates in the backtrace cone of the clock inputs of the failing gate. The pin data shows the pattern value the tool simulated when it encountered the error.

D10 (FastScan Only) — The netlist contains a transparent capture cell that feeds logic requiring both the new and old values. Upon invocation, the tool reports failures as Errors. FastScan models failing source gates as TIEX regardless of the reporting you specify.

D11 (FastScan Only) — The netlist contains a transparent capture cell that connects to primary output pins. Upon invocation, the tool reports failures as Warnings and does not use the associated primary output pins (expected values are X). If you specify to Ignore D11 violations with the Set Drc Handling command, you can perform “what-if” analysis of a sub-block on the assumption that all its primary output pins will feed scan cells, and so FastScan eventually removes the cause of the D11 (or possibly replaces it with a D10 violation). In this case the reported fault coverage does not consider the effect of reconvergence through transparent capture cells, and so may not always be accurate. When you Ignore this DRC, patterns that you save may be invalid.

The following lists the Extra rules violation IDs. For a complete description of these violations refer to the “ Extra Rules” section of the Design-for-Test: Common Resources Manual.

E2 — There must be no inversion between adjacent scan cells, the scan chain input pin (SCI) and its adjacent scan cell, and the scan chain output pin (SCO) and its adjacent scan cell.

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