Test Pattern File Formats | FastScan Test Pattern File Format |
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The type of procedures may include shift procedure, load and unload procedure,
FORCE “primary_input_pin” <value> <time>;
This command is used to force a value (0,1, X, or Z) on a selected primary input pin at a given time. The time values must not be lower than previous time values for that procedure. The time for each procedure begins again at time 0. The primary input pin will be enclosed in double quotes.
APPLY “scan_group_procedure_name” <#times> <time>;
This command indicates the selected procedure name is to be applied the selected number of times beginning at the selected time. The scan group procedure name will be enclosed in double quotes. This command may only be used inside the load and unload procedures.
FORCE_SCI “scan_chain_name” <time>;
This command indicates the time in the shift procedure that values are to be placed on the scan chain inputs. The scan chain name will be enclosed in double quotes.
MEASURE_SCO “scan_chain_name” <time>;
This command indicates the time in the shift procedure that values are to be measured on the scan chain outputs. The scan chain name will be enclosed in double quotes.
Functional_Chain_Test
The functional_chain_test section contains a definition of a functional scan chain test for all scan chains in the circuit to be tested. For each scan chain group, the scan chain test will include a load of alternating double zeros and double ones (00110011...) followed by an unload of those values for all scan chains of the group. The format is as follows:
FastScan and FlexTest Reference Manual, V8.6_4 |
