Command Dictionary

Analyze Atpg Constraints

 

 

satisfied by itself, but some set of constraints cannot all be satisfied. In this case, -Auto switch proceeds to a second analysis where it adds atpg constraints to a set to create a minimal set that can’t be satisfied.

-ALl

An optional switch that specifies for FastScan and FlexTest to perform the ATPG analysis simultaneously for all the current ATPG constraints. This is the command default if you do not specify an object name.

pin_pathname

A repeatable string that specifies the pathname to the pin on which you are analyzing the constraints.

gate_id#

A repeatable integer that specifies the gate identification number of the gate on which you wish to analyze the constraints.

function_name

A repeatable string that specifies the name of a function you created with the Add Atpg Functions command. If you generated the ATPG function with the -Cell option and added constraints with the -Cell option, then the tool also analyzes the constraints on all the cells affected by that ATPG function.

-Satisfy (FastScan Only)

An optional switch that specifies for the ATPG process to attempt to create a pattern that satisfies the selected ATPG constraint. This is the default if you specify an object name without a switch. During the ATPG process, the test generator does not consider the effect of other ATPG constraints or bus contention prevention (unless you use the -Bus switch).

When the command finishes, FastScan displays a message indicating whether the analysis passed (the ATPG process successfully generated a pattern), failed (the ATPG process could not find any possible pattern), or aborted (the ATPG process gave up on trying to find a successful pattern). If the analysis passes, the data that FastScan simulated for the pattern is available in parallel pattern zero (0).

FastScan and FlexTest Reference Manual, V8.6_4

2-121

Page 149
Image 149
Mentor v8.6_4 manual ∙ pinpathname, ∙ gateid#, ∙ functionname