Mentor v8.6_4 manual Set AU Analysis, ∙ on, ∙ OFf

Set AU Analysis Command Dictionary

Set AU Analysis

Tools Supported: FastScan

Scope: All modes

Usage

SET AU Analysis {ON OFf}

Description

Specifies whether the ATPG uses the ATPG untestable information to place ATPG untestable faults directly in the AU fault class.

The Set AU Analysis command specifies whether the ATPG process can use the ATPG untestable information. Upon invocation of FastScan, the AU analysis is set to On; therefore, the ATPG process uses the ATPG untestable information.

Once FastScan places a fault in the AU fault class, FastScan removes the fault from the active fault list and does not simulate it. This prevents the ATPG process from identifying the faults as possibly-detected during an ATPG run. However, you may use a switch on the Compress Patterns command to identify possible detections of AU faults.

Arguments

∙ON

A literal that specifies for FastScan to use the ATPG untestable information to place ATPG untestable faults directly in the AU fault class during any future ATPG processes. This is the invocation default.

∙OFf

A literal that specifies for FastScan not to use the ATPG untestable information to place ATPG untestable faults directly in the AU fault class during any future ATPG processes.

2-434 FastScan and FlexTest Reference Manual, V8.6_4