FastScan and FlexTest Reference Manual, V8.6_4
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Set AU Analysis Command Dictionary
Set AU Analysis
Tools Supported: FastScan
Scope: All modes
Usage
SET AU Analysis {ON | OFf}
Description
Specifies whether the ATPG uses the ATPG untestable information to place
ATPG untestable faults directly in the AU fault class.
The Set AU Analysis command specifies whether the ATPG process can use the
ATPG untestable information. Upon invocation of FastScan, the AU analysis is
set to On; therefore, the ATPG process uses the ATPG untestable information.
Once FastScan places a fault in the AU fault class, FastScan removes the fault
from the active fault list and does not simulate it. This prevents the ATPG process
from identifying the faults as possibly-detected during an ATPG run. However,
you may use a switch on the Compress Patterns command to identify possible
detections of AU faults.
Arguments
•ON
A literal that specifies for FastScan to use the ATPG untestable information to
place ATPG untestable faults directly in the AU fault class during any future
ATPG processes. This is the invocation default.
•OFf
A literal that specifies for FastScan not to use the ATPG untestable
information to place ATPG untestable faults directly in the AU fault class
during any future ATPG processes.