FastScan and FlexTest Reference Manual, V8.6_4
4-2
FastScan Test Pattern File Format Test Pattern File Formats
// date - the date in which the scan model creation was performed.
// statistics - the test coverage, the number of faults for each fault class, and
the total number of test patterns.
// settings - the description of the environment of which the ATPG is
performed.
// messages - any warning messages about bus contention, pins held,
equivalent pins, clock rules, etc. are noted.
Setup_DataThe setup_data section contains the definition of the scan structure and general
test procedures that will be referenced in the description of the test patterns. The
data printed will be in the following format:
SETUP =
<setup information>
END;
The setup information will include the following:
declare input bus “PI” = <ordered list of primary inputs>;
This defines the list of primary inputs that are contained in the circuit. Each
primary input will be enclosed in double quotes and be separated by commas. For
bidirectional pins, they will be placed in both the input and output bus.
declare output bus “PO” = <ordered list of primary outputs>;
This defines the list of primary outputs that are contained in the circuit. Each
primary output will be enclosed in double quotes and be separated by commas.