FastScan and FlexTest Reference Manual, V8.6_4
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Acronyms Used in This Manual About This Manual
GENIE - General Interpreted Environment
IDDQ - Quiescent Drain Current
I/O - Input/Output
JTAG - Joint Test Action Group
LFSR - Linear Feedback Shift Register
LSSD - Level Sensitive Scan Design
MCM - Multi-Chip Module
MISR - Multiple Input Signature Register
PGS - Pulse Generator Sink
PI - Primary Input
PRPG - Pseudo-Random Pattern Generator
PO - Primary Output
PU - Posdet_Untestable fault
SFP - Single Fault Propagation
TDL - TEGAS Design Language
UI - User Interface
VHDL - VHSIC Hardware Description Language
VHSIC - Very High Speed IC
WDB - Waveform DataBase