Mentor v8.6_4 manual Acronyms Used in This Manual About This Manual

Acronyms Used in This Manual About This Manual

GENIE - General Interpreted Environment

IDDQ - Quiescent Drain Current

I/O - Input/Output

JTAG - Joint Test Action Group

LFSR - Linear Feedback Shift Register

LSSD - Level Sensitive Scan Design

MCM - Multi-Chip Module

MISR - Multiple Input Signature Register

PGS - Pulse Generator Sink

PI - Primary Input

PRPG - Pseudo-Random Pattern Generator

PO - Primary Output

PU - Posdet_Untestable fault

SFP - Single Fault Propagation

TDL - TEGAS Design Language

UI - User Interface

VHDL - VHSIC Hardware Description Language

VHSIC - Very High Speed IC

WDB - Waveform DataBase

xxii FastScan and FlexTest Reference Manual, V8.6_4