Lucent Technologies 555-233-119 3-447DATA-CHL (Data Channel) , all

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-447DATA-CHL (Data Channel)
3
40
2000
2003
2004
FAIL In the case of Error Code 40, the Local Loop Back Test failed because the
data received over the connection did not match the d ata sent over the
connection (data was corrupted). In the case of Error Code 2000, 2003,
and 2004, the Local Loop Back Test failed because the data looped over
the connection was not received (data was lost).
1. Determine whic h of the DATA-CHLs are in use for some other function
(that i s, PRI-C DR/SEC-CD R, SYS-PRNT, PMS- PRNT/JNL- PRNT,
PMS-LINK or secondary administration terminal connection) as
described previously in the ‘‘Status of Data Channels’’ section.
2. The most likely problem is that the target DATA-CHL is defective.
Busyout all functions that are using the Data Channels (DATA-CHLs).
!CAUTION:
All functions must be busied out because Test #107 is destructive
and terminates all established connections over the DATA-CHLs.
3. Issue the test data-module <ext> long command for the target
DATA-CHL. Note the test results for Tests #107 and #108.
a. If the result of Test #107 is FAIL, then the Processor circuit pack is
defective.
1. Replace the Processor circ uit pack at your earli est
convenience. After the Processor circuit pack has been
replaced, its Time-of-Day clock must be set using the set time
command.
2. Repeat the test.
b. If the result of Test #107 is PASS and the result of Test #108 is FAIL:
1. Although all DATA-CHLs are unusable, the SW-CTL is still
operational. Based on the customer’s use of DATA-CHLs,
replace the Processor circuit pack at the customer’s
convenience. After the Processor circuit pack has been
replaced, its Time-of-Day clock must be set using the set time
command.
2. Repeat the test.
Table 3-189. TEST #111 Data Channel Local Loop Back Test — Continued
Error
Code
Test
Result Description/Recommendation
Continued on next page