Lucent Technologies 555-233-119 System Technician-Demanded Tests: Descriptions , Memory Card Capacity Test (#1014)

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-325CAP-MEM (Memory Card Capacity)
3
System Technician-Demanded Tests: Descriptions
and Error Codes
Investigate errors in the order they ap pear in the table below.
Notes:
a. Refer to 12V-PWR (12-Volt Power Supply) Maintenance documentation for
a description of this test.
b. Refer to CARD-MEM (Memory Card) Maintenance doc umentation for a
description of this test.
Memory Card Capacity Test (#1014)
This nondestructive test verifies that the memory c ard is using less than 98% of
its translation storage spac e.
This test runs
■during period ic and sched ule maintenance
■on demand (test card-mem long, save translation).
Order of Investigation
Short Test
Sequence
Long Test
Sequence D/ND1
1. D = Destructive; ND = Nondestruc tive
12-Volt Power Supply Test (#701) (a) X X ND
Memory Card Insertion Test (#695) (b) X X ND
Memory Card Format and Read Test (#696) (b) X X ND
Memory Card Match Test (#697) (b) X X ND
Memory Card Write-Protected Test (#698) (b) X X ND
Memory Card Directory Recovery Test (#699) (b) X X ND
Memory Card Translation Data Integrity Test (#694) (b) X ND
Memory Card Erase/Write/Read Test (#693) (b) X ND
Memory Card Capacity Test (#1014) X ND