Lucent Technologies 555-233-119 One-Way Span Test (#1214)

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-612DS1-BD (DS1 Interface Circuit Pack)
3
One-Way Span Test (#1214)
This test is destructive.
The One-Way Span Test allows one-way span testing to and from remote test
equipment or another DEFINITY communications system. This will test all
circuitry and fac ilities from the local TN767E DS1 board to the remote test
equipment or other DEFINITY communications system.
The test is destructive and c an only be initiated by a sy stem technician
demanded
test ds1-loop UUCSS one-way-span-test-b egin command.
All trunks or ports on the DS1 Interface c ircuit pack must b e busied out via the
system technician busyout board command before running the One-Way Span
Tes t .
The One-Way Span Test has the TN767E DS1 Interface circuit pac k transmit a
framed 3-in-24 test pattern and attempt to receive and verify t he pattern. If the
TN767E board receives a framed 3-in-24 test patter n sent from another DEFINITY
G3V3 or test equipment at the far-end of the DS1, it will beg in counting bit errors
within the received patter n.
The status of the One-Way Span test will be available in the hardware error log
via error type 3902. Several distinct au x values will be used to give the user
information of the status of the test.
The
list measurements ds1 summary command will disp lay the length of time the
test has been running (
Test Duration field) and number of b it errors detected
(
Loopback/Span Test Bit-Error Count field). If the test pattern is b eing sent
cleanly over the span from the far-end , the number of bit errors should b e very
low. The
Tes t D u ra t io n field will show 0 until the test pattern is received from the
far-end. Upon receiving the test pattern, the board will begin calcu lating the test
duration and number of b it errors. The command will also disp lay the type of
loopback/sp an test executing (
Tes t field), the type of patter n generated for the
loopback /span t est (
Pattern field), and whether the patter n ( i.e. 3-in-24 Pattern ) is
synchronized (
Synchronized field).
To terminate the test, enter the
test ds1-loop UUCSS end-loopback/span-test
command or the release board c ommand. Using the release board c ommand
will restore all trunks or ports on the TN767E DS1 Interface circuit p ack to the
in-service state.