Lucent Technologies 555-233-119 Memory Functional Test (#332), Memory Burst Read Test (#908)

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-959PR-MEM (RISC Memory)
3
Memory Functional Test (#332)
This test is destructive.
This test ensures that every DRAM memory location can b e accessed and
changed ind ependently. Running this test wipes out all d ata in DRAM memory.
This test i s perfor med during a reset system 4 or reset system 5. If the test fails
during a reset system command, refer to the ‘‘ Proce dure f or SPE-Do wn Mod e’’
in Chapter 1, ‘‘Maintenance for c si systems’’ for the recommended mainte nance
strategy.
Memory Burst Read Test (#908)
This test verifies that the Memory Burst Read function works prop erly on the
Processor circuit pac k.
1 - 7 FAIL The parity detection circuitry is not working correctly. If the system can still
provide service, this indicates that the Processor circuit pack has a p roblem
but can still function.
1. The Processor circuit pack should be replac ed. The failure is identifying
the PROCR as being bad and only the PROCR circuit pack needs to be
replaced.
PASS The parity detection circuitry is working.
Table 3-418. TEST #332 Memory Functional Test
Error
Code
Test
Result Description/ Recommendation
100 ABORT The test did not complete within the allowable time period.
1. Retry the command.
1000 ABORT System resources required to run this test are not available.
1. Retry the command at 1-minute intervals a maximum of 3 times.
PASS Th e DRAM is h ealth y.
Continued on next page
Table 3-417. TEST #87 Memory Parity Error Detection Test — Continued
Error
Code
Test
Result Description/ Recommendation
Continued on next page