Lucent Technologies 555-233-119 Memory Parity Error Detection Test (#87)

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-958PR-MEM (RISC Memory)
3
Memory Parity Error Detection Test (#87)
This test is a nondestructive test. The test is run on a few reserved lo cations in
memory. A failure of this test indicates a failure on the Processor c ircuit pack.
This test determines if the parity circ uitry is working. Acc ordingly, the test
determines if parity errors c an be detected . The parity circuitry is used to d etect
DRAM memory failures.
Table 3-416. TEST #86 Text Checksum Test
Error
Code
Test
Result Description/ Recommendation
100 ABORT The test did not complete within the allowable time period.
1. Retry the command.
2500 ABORT Internal system error
1. Retry the command.
1 - 7 FAIL The system may or may not continue to operate correctly. The system may
fail later when some action requires access to the corrupted area of the
Text.
1. The Flash ROM should be reprogrammed via the upgrade software
command. The memory card should contain the same vintage
software that is currently in the system.
2. If the test continues to fail, replace the Processor circuit pack and
repeat step 1.
PASS The checksum is correct.
Continued on next page
Table 3-417. TEST #87 Memory Parity Error Detection Test
Error
Code
Test
Result Description/ Recommendation
100 ABORT The test did not complete within the allowable time period.
1. Retry the command.
2500 ABORT Internal system error
1. Retry the command.
Continued on next page