Lucent Technologies 555-233-119 Loop Around and Conference Test (#47)

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-64ANL-LINE (8-Port Analog Line), ANL-NE-L (8-Port Neon Analog Line)
3
Loop Around and Conference Test (#47)
Each Analog Port consists of:
■an NPE for port connectivity and g ain, and conferencing functionality
■a code that convert s the digital signals of the TDM Bus to analog signals
■a battery feed chip that provides power to the telep hone set for signaling,
dial pulsing, transmission, and balance
This test is designed to che ck the on-board transmission c apabilities of the NPE,
the code, and the b attery feed chip of the An alog Port. A Tone Detector and a
Tone Generator talk and listen on the same pair of time slots as the Analog Port.
The Analog Port is then instructed to g o into loop around mode (see Figure 10-2 ).
The test passes if the signal measured b y the Tone Detector is within acceptable
limits.
The Conference Circuit Test verifies that the NPE channel for the port being
tested can correc tly perform the conferencing function. As part of Test #47, the
operation of the port co nference circuits in the NPE for three and four par ties is
also tested. In addition, a test is run to measure noise. The NPE is instructed to
listen to several different tones and c onference the tones together. The resulting
signal is then measured by a Tone Detector port. If the level of the tone is within a
certain range, the test p asses.
The noise test is performed by filtering out the tone and then measuring inherent
port noise.
NOTE:
This Loop Around Test is sensitive to the length of the loop, the eq uipment
in the loop, or the equipm ent terminating the loop, such as off-premises
stations. If this test is causing a false alar m, then disable the test by
changing the Tests field to "no" using the change station command for this
station.