Lucent Technologies 555-233-119 Loopback/Span Test Bit-Error Count

DEFINITY ECS Release 8.2 Maintenance for R8.2csi 555-233-119 Issue 1
April 2000
Maintenance Objects
3-618DS1-BD (DS1 Interface Circuit Pack)
3
The list measurements ds1 summary command will disp lay the length of time the
test ran (
Test Duration field) and number of b it errors detected ( Loopback/Span
Test Bit-Error Count
field).
To restore the trunks or ports on the TN767E DS1 Interface circuit pack to the
in-service state, execute the release boa rd command.
Table 3-255. TEST #1216 End Loopback/Span Test
Error
Code
Test
Result Description/ Recommendation
ABORT Internal system error
1. Retry the
test ds1-loop UUCSS end-loopback/span-test command at
1-minute intervals a maximum of 5 times.
1005 ABORT End Loopback/Span Test cannot be executed in the c urrent configuration. To
run this, the TN767E or later suffix DS1 must be adm inistered for 24-channe l
operation. The "Bit Rate" fiel d on the DS1 circuit pack administration form must
be set to "1.544" for 24-channel operation.
1015 ABORT Ports on the DS1 Interface circuit pack have not been busied out to
out-of-service.
1. Enter the busyout board UUCSS command to put all trunks or ports of the
DS1 Interface circuit pack into the out-of-service state.
2. Retry the command.
ABORT Internal system error
2100 ABORT Could not allocate the necessary system resources to run this test.
1. Retry the command at 1-minute intervals for a maximum of 5 times.
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